Key Technologies for 500 MHz VLSI Test System "ULTIMATE".

Teruo Tamama Naoaki Narumi Taiichi Otsuji Masao Suzuki Tsuneta Sudo

Published in: ITC (1988)

Keyphrases

key technologies
high speed
test data
computer vision
vlsi design
neural network
real world
information retrieval
genetic algorithm
video sequences
signal processing