A deterministic BIST scheme based on EDT-compressed test patterns.

Grzegorz Mrugalski Janusz Rajski Lukasz Rybak Jedrzej Solecki Jerzy Tyszer

Published in: ITC (2015)

Keyphrases

built in self test
pattern discovery
learning scheme
classification scheme
black box
detection scheme
neural network
computational complexity
multi dimensional
data mining techniques
data compression
relaxation algorithm