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Raman Spectroscopy-Based Quality Control of "Silicon-On-Insulator" Nanowire Chips for the Detection of Brain Cancer-Associated MicroRNA in Plasma.

Kristina A. MalsagovaVladimir PopovIgor N. KupriyanovTatyana PleshakovaRafael A. GaliullinAndrey F. KozlovIvan D. ShumovDmitry I. LarionovFedor V. TikhonenkoSvetlana I. KapustinaVadim S. ZiborovOleg F. PetrovOlga A. GadzhievaBoris A. BashiryanVadim N. ShimanskyAlexander I. ArchakovYuri D. Ivanov
Published in: Sensors (2021)
Keyphrases
  • quality control
  • machine vision
  • quality assurance
  • raman spectra
  • manufacturing systems
  • product quality
  • automated visual inspection
  • signal processing
  • integrated circuit
  • computer vision
  • low cost