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Thermal resistance modeling in FDSOI transistors with industry standard model BSIM-IMG.

Pragya KushwahaK. Bala KrishnaHarshit AgarwalSourabh KhandelwalJuan Pablo DuarteChenming HuYogesh Singh Chauhan
Published in: Microelectron. J. (2016)
Keyphrases
  • standard model
  • signature scheme
  • diffie hellman
  • database
  • ciphertext
  • proxy re encryption