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Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric Tunnel Junctions.

Ayse SünbülTarek AliRaik HoffmannRicardo RevelloYannick RaffelPardeep DuhanDavid LehningerKati KühnelMatthias RudolphSebastian OehlerPhilipp SchrammMalte CzernohorskyKonrad SeidelThomas KämpfeLukas M. Eng
Published in: IRPS (2022)
Keyphrases
  • databases
  • simulation model
  • database
  • endpoints
  • high impact
  • high speed
  • junction detection