Fast march tests for defects in resistive memory.

Seyed Nima Mozaffari Spyros Tragoudas Themistoklis Haniotakis

Published in: NANOARCH (2015)

Keyphrases

statistical tests
memory requirements
low memory
limited memory
memory usage
computing power
real time
neural network
image processing
associative memory
memory size
defect classification
internal memory
external memory
memory space
information systems
databases