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Post-fabrication clock-timing adjustment using genetic algorithms.
Eiichi Takahashi
Yuji Kasai
Masahiro Murakawa
Tetsuya Higuchi
Published in:
IEEE J. Solid State Circuits (2004)
Keyphrases
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high speed
integrated circuit
high density
power consumption
case study
database
data sets
genetic algorithm
electron beam
data mining
computer vision
website
high level
semiconductor devices
thin film transistor
duty cycle