Built-In-Self-Testing Techniques for Programmable Capacitor Arrays.

Amit Laknaur Sai Raghuram Durbha Haibo Wang

Published in: J. Electron. Test. (2006)

Keyphrases

test cases
power supply
neural network
decision trees
general purpose
statistical tests
data sets
software testing
test suite
learning algorithm
cellular automata
software development
case study
transmission line
database
single chip
short circuit