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Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories.

Kuo-Liang ChengMing-Fu TsaiCheng-Wen Wu
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2002)
Keyphrases
  • random access
  • associative memory
  • solid state
  • fault diagnosis
  • fault model
  • multiview video coding
  • disk storage
  • memory size
  • expert systems
  • pattern matching
  • hard disk
  • database
  • flash memory