On the reliability estimation of nano-circuits using neural networks.
Azam BegFalah AwwadWalid IbrahimFaheem AhmedPublished in: Microprocess. Microsystems (2015)
Keyphrases
- neural network
- pattern recognition
- neural network model
- multi layer
- nano scale
- neural nets
- high speed
- back propagation
- artificial neural networks
- rule extraction
- analog circuits
- feed forward
- self organizing maps
- fault diagnosis
- vlsi circuits
- genetic algorithm
- delay insensitive
- digital circuits
- circuit design
- atomic force microscopy
- learning rules
- fuzzy neural network
- multilayer perceptron
- computational intelligence
- evolutionary algorithm
- decision making
- data mining