A New Approach to Derive Robust Sets for Stuck-open Faults in CMOS Combinational Logic Circuits.

Jhing-Fa Wang Tah-Yuan Kuo Jau-Yien Lee

Published in: DAC (1989)

Keyphrases

logic circuits
low power
power consumption
high speed
low cost
power dissipation
functional decomposition
tunnel diode
cmos technology
image sensor
fault diagnosis
circuit design
logic synthesis
dynamic programming
fault detection