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A New Approach to Derive Robust Sets for Stuck-open Faults in CMOS Combinational Logic Circuits.
Jhing-Fa Wang
Tah-Yuan Kuo
Jau-Yien Lee
Published in:
DAC (1989)
Keyphrases
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logic circuits
low power
power consumption
high speed
low cost
power dissipation
functional decomposition
tunnel diode
cmos technology
image sensor
fault diagnosis
circuit design
logic synthesis
dynamic programming
fault detection