A Strategy for Enhancing Fault Coverage on VLSI Circuit Boards Using Performance In-Circuit Test Techniques.
Mike FabishPublished in: ITC (1986)
Keyphrases
- high speed
- circuit design
- power dissipation
- analog circuits
- gate array
- electronic circuits
- digital circuits
- low power
- neural network
- chip design
- selection strategy
- real world
- gallium arsenide
- single phase
- vlsi circuits
- hardware software co design
- vlsi implementation
- duty cycle
- logic synthesis
- evolvable hardware
- real time
- databases