Bias stress induced threshold voltage shift in buckled thin film transistors.

Aswathi R. Nair Venu Anand Sanjiv Sambandan

Published in: TENCON (2019)

Keyphrases

thin film
high density
short circuit
room temperature
field effect transistors
low density
grain size
power consumption
solar cell
data center
multi layer
power system
plasma etching
white light interferometry
electric field
machine learning
integrated circuit
artificial neural networks