Aliasing error for a mask ROM built-in self-test.

Kazuhiko Iwasaki Akinori Furuta Shigeo Nakamura

Published in: VTS (1994)

Keyphrases

reconstruction error
error rate
built in self test
error bounds
high frequency
database
information retrieval
frequency domain
light field
color filter array
real time
neural network
relative error
error detection