An All-Digital Unified Physically Unclonable Function and True Random Number Generator Featuring Self-Calibrating Hierarchical Von Neumann Extraction in 14-nm Tri-gate CMOS.
Sudhir SatpathySanu K. MathewRaghavan KumarVikram B. SureshMark A. AndersHimanshu KaulAmit AgarwalSteven HsuRam K. KrishnamurthyVivek DePublished in: IEEE J. Solid State Circuits (2019)