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Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests.
Yi-Jun Lu
Ziquan Guo
Tien-Mo Shih
Yulin Gao
Wei-Lin Huang
Hong-Li Lu
Yue Lin
Zhong Chen
Published in:
IEEE Trans. Reliab. (2016)
Keyphrases
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room temperature
high temperature
light emitting diodes
thin film
video camera
light emitting
silicon dioxide
age estimation
diesel engine
image sequences
object detection
appearance model
data center
feed forward
sludge compost