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An on-chip glitchy-clock generator for testing fault injection attacks.

Sho EndoTakeshi SugawaraNaofumi HommaTakafumi AokiAkashi Satoh
Published in: J. Cryptogr. Eng. (2011)
Keyphrases
  • high speed
  • injection attacks
  • fault diagnosis
  • fault model
  • recommender systems
  • low cost
  • information systems
  • power consumption
  • expert systems
  • collaborative recommender systems