An Interconnect Reliability-Driven Routing Technique for Electromigration Failure Avoidance.
Xiaodao ChenChen LiaoTongquan WeiShiyan HuPublished in: IEEE Trans. Dependable Secur. Comput. (2012)
Keyphrases
- failure rate
- highly reliable
- link failure
- interconnection networks
- network reliability
- high speed
- routing problem
- network topology
- data driven
- routing algorithm
- shortest path
- routing protocol
- ad hoc networks
- inter domain
- mobile ad hoc networks
- artificial intelligence
- reliability analysis
- real time
- databases
- ant algorithm
- failure recovery
- path selection
- traffic engineering
- network topologies
- wireless ad hoc networks
- transmission line
- response time
- neural network