Test Metrics Model for Analog Test Development.
Haralampos-G. D. StratigopoulosPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)
Keyphrases
- computational model
- test data
- experimental data
- probabilistic model
- probability distribution
- theoretical framework
- mathematical model
- software testing
- feature selection
- statistical tests
- neural network model
- statistical model
- management system
- cost function
- prior knowledge
- objective function
- similarity measure
- decision making