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An Embedded Test Circuit for RF Single Ended Low Noise Amplifiers.

Lampros DermentzoglouAnastasios KaragounisAggeliki ArapoyanniYiorgos Tsiatouhas
Published in: ICECS (2007)
Keyphrases
  • high noise
  • noise reduction
  • low signal to noise ratio
  • random noise
  • noisy data
  • neural network
  • multiscale
  • high speed
  • test cases
  • noise model
  • radio frequency
  • analog vlsi