Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem.
Walid IbrahimAmr El-ChouemiHesham El-SayedPublished in: AICCSA (2006)
Keyphrases
- genetic algorithm
- simulated annealing
- tabu search
- signal processing
- set of test cases
- test cases
- search algorithm
- high speed
- dynamic programming
- test suite
- evolutionary algorithm
- artificial neural networks
- optimal solution
- search heuristics
- data sets
- vlsi design
- memetic algorithm
- constraint satisfaction
- neural network
- evolutionary computation
- differential evolution
- fitness function
- optimization algorithm
- fuzzy logic
- genetic search
- branch and bound procedure
- real time