An Efficient Deterministic Test Pattern Generator for Scan-Based BIST Environment.

Wei-Lun Wang Kuen-Jong Lee

Published in: J. Electron. Test. (2002)

Keyphrases

pattern generator
mobile robot
real time
computer vision
neural network
real world
lower bound
multi modal
dynamic environments
virtual environment
test data
autonomous agents
indoor environments
simulation environment
built in self test