Identification of a Dynamic Model for a Thin Film Deposition Process using a Self-Organizing Map.
Cihan OguzMartha A. GallivanPublished in: IJCNN (2006)
Keyphrases
- thin film
- dynamic model
- self organizing maps
- unsupervised learning
- multi layer
- neural network
- input data
- training data
- experimental data
- cost effective
- high density
- learning vector quantization
- plasma etching
- edge detection
- k means
- maximum likelihood
- decision trees
- feature selection
- computer vision
- database
- short circuit