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Statistical Design Optimization of FinFET SRAM Using Back-Gate Voltage.
Behzad Ebrahimi
Masoud Rostami
Ali Afzali-Kusha
Massoud Pedram
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2011)
Keyphrases
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low voltage
leakage current
statistical analysis
information theoretic
power consumption
statistical inference
database
data driven
cmos technology
field effect transistors
low cost
low power