Login / Signup

Statistical Design Optimization of FinFET SRAM Using Back-Gate Voltage.

Behzad EbrahimiMasoud RostamiAli Afzali-KushaMassoud Pedram
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2011)
Keyphrases
  • low voltage
  • leakage current
  • statistical analysis
  • information theoretic
  • power consumption
  • statistical inference
  • database
  • data driven
  • cmos technology
  • field effect transistors
  • low cost
  • low power