Compact two-pattern test set generation for combinational and full scan circuits.

Ilker Hamzaoglu Janak H. Patel

Published in: ITC (1998)

Keyphrases

test set
error rate
training set
logic circuits
asynchronous circuits
training data
test data
pattern matching
test cases
evaluation methodology
class distribution
machine learning
active learning
input image
high speed
image processing
low power