Post-silicon debugging targeting electrical errors with patchable controllers (abstract only).

Masahiro Fujita Hiroaki Yoshida

Published in: FPGA (2012)

Keyphrases

low cost
high speed
fault localization
high density
control system
power grid
high level
higher level
distribution networks
model based diagnosis
computer engineering
data sets
thin film
error analysis
integrated circuit
estimation error
control strategy