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Resistance-Switching Characteristics of Si-rich Oxide Evaluated by Using Ni Nanodots as Electrodes in Conductive AFM Measurements.

Akio OhtaChong LiuTakashi AraiDaichi TakeuchiHai ZhangKatsunori MakiharaSeiichi Miyazaki
Published in: IEICE Trans. Electron. (2015)
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