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Enhancing security in X-ray baggage scans: A contour-driven learning approach for abnormality classification and instance segmentation.

Abdelfatah Hassan AhmedDivya VelayudhanTaimur HassanMohammed BennamounErnesto DamianiNaoufel Werghi
Published in: Eng. Appl. Artif. Intell. (2024)
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