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IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware.

Peiyu LiuShouling JiXuhong ZhangQinming DaiKangjie LuLirong FuWenzhi ChenPeng ChengWenhai WangRaheem Beyah
Published in: ASE (2021)
Keyphrases
  • databases
  • management system
  • fault diagnosis
  • machine learning
  • information retrieval
  • case study
  • state space
  • fuzzy logic
  • cloud computing
  • lightweight
  • statistical tests
  • highly efficient
  • fault detection