Logic circuit design for testability using orthonormal expansions.
Ryuichi TakahashiTakashi NanyaPublished in: Systems and Computers in Japan (1995)
Keyphrases
- circuit design
- digital circuits
- design automation
- modal logic
- denoising
- vector field
- probability theory
- classical logic
- multiresolution
- floating gate
- proof theory
- deontic logic
- multi valued
- singular value decomposition
- basis functions
- sparse matrix
- asynchronous circuits
- test data generation
- logic programming
- least squares
- data sets
- orthogonal matrices