An optimal test pattern selection method to improve the defect coverage.
Yuxin TianMichael R. GrimailaWeiping ShiM. Ray MercerPublished in: ITC (2005)
Keyphrases
- dynamic programming
- synthetic data
- high accuracy
- preprocessing
- pairwise
- significant improvement
- prior knowledge
- test data
- computational cost
- experimental evaluation
- detection method
- high precision
- similarity measure
- computational complexity
- cost function
- evolutionary algorithm
- optimal selection
- selection algorithm
- classification method
- support vector machine
- pattern matching
- theoretical analysis
- computationally efficient
- edge detection
- support vector
- reinforcement learning