Efficient Utilization of Test Elevators to Reduce Test Time in 3D-ICs.

Sreenivaas S. Muthyala Nur A. Touba

Published in: VLSI-SoC (Selected Papers) (2014)

Keyphrases

artificial intelligence
test cases
database
wide range
neural network
computer vision
multimedia
image segmentation
reinforcement learning
learning environment
object recognition
pairwise
cost effective
statistical tests