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Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor.
Román Mozuelos
Yolanda Lechuga
Mar Martínez
Salvador Bracho
Published in:
J. Electron. Test. (2011)
Keyphrases
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analog circuits
digital circuits
neural network
sensor data
sensor networks
fault diagnosis
real time
artificial intelligence
signal processing
statistical tests
sensor fusion
micro controller