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Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor.

Román MozuelosYolanda LechugaMar MartínezSalvador Bracho
Published in: J. Electron. Test. (2011)
Keyphrases
  • analog circuits
  • digital circuits
  • neural network
  • sensor data
  • sensor networks
  • fault diagnosis
  • real time
  • artificial intelligence
  • signal processing
  • statistical tests
  • sensor fusion
  • micro controller