EM and substrate coupling in silicon RFICs.
Rony E. AmayaPeter H. R. PopplewellMark CloutierCalvin PlettPublished in: IEEE J. Solid State Circuits (2005)
Keyphrases
- semiconductor devices
- expectation maximization
- em algorithm
- low cost
- high speed
- probabilistic model
- maximum likelihood
- expectation maximisation
- mixture model
- magnetic recording
- high density
- gaussian mixture model
- gaussian mixture
- gaussian distribution
- unsupervised learning
- bayesian framework
- cmos technology
- real time
- generative model
- transmission electron microscopy
- silicon dioxide