Integrated Approach for Circuit and Fault Extraction of VLSI Circuits.

Fernando M. Gonçalves Isabel C. Teixeira João Paulo Teixeira

Published in: DFT (1996)

Keyphrases

vlsi circuits
low power
fault diagnosis
information extraction
mixed signal
low cost
high speed
power dissipation
image analysis
signal processing
multi channel
cmos technology
fault model