A Bayesian Appraoch to Fault Classification.
Tein-Hsiang LinKang G. ShinPublished in: SIGMETRICS (1990)
Keyphrases
- classification systems
- classification scheme
- pattern classification
- pattern recognition
- support vector machine
- classification accuracy
- neural network
- classification method
- image classification
- feature vectors
- training set
- machine learning
- preprocessing
- classification process
- support vector machine svm
- supervised classification
- classification algorithm
- fault detection
- automatic classification
- feature extraction
- bayesian classification
- eeg signals
- data sets
- decision trees
- class labels
- maximum likelihood
- bayesian networks
- supervised learning
- feature space