BAYESIAN CLASSIFICATION
Experts
- Edward R. Dougherty
- Aly A. Farag
- Sakir Sezer
- Michel Verleysen
- Peter K. Willett
- Robert S. Lynch Jr.
- Homayoun Valafar
- Suleiman Y. Yerima
- Gavin McWilliams
- Faramarz Valafar
- John C. Stutz
- Philippe Thissen
- Peter C. Cheeseman
- Chengsheng Mao
- Massoud Pedram
- Bin Hu
- Jean-Didier Legat
- Anil K. Jain
- Don Freeman
- Igor Muttik
- Seppo Puuronen
- Wesley J. Maddox
- Xingxin Li
- Ariana Broumand
- Masanobu Yamamoto
- Reda Alhajj
- Lijuan Lu
- Yuan (Alan) Qi
- Matthew Self
- William S. York
- Taisuke Sato
- Frans Coetzee
- Youwen Zhu
- James Kelly
- Jian Wang
- Steve Lawrence
- Lu Yu
- Jose H. Blanchet
- Andrew Gordon Wilson
Venues
- CoRR
- IEEE Trans. Signal Process.
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- ICIP (2)
- Expert Syst. Appl.
- FUSION
- IEEE ACM Trans. Comput. Biol. Bioinform.
- IWANN
- ESANN
- J. Intell. Manuf.
- BIBM
- ICASSP
- UAI
- ICML
- IEEE Trans. Medical Imaging
- ICMLA
- IC-AI
- Knowl. Based Syst.
- Soft Comput.
- IEEE Trans. Syst. Man Cybern. Part B
- IEEE Trans. Biomed. Eng.
- Pattern Recognit. Lett.
- Business Process Management Workshops
- CinC
- Inf. Sci.
- ICSED
- AAAI
- ISCRAM
- Scale-Space
- AMIA
- IJCNN
- Comput. Inf. Sci.
- ML
- J. Comput. Neurosci.
- FLAIRS Conference
- Optim. Lett.
- GENSiPS
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