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Average Leakage Current Macromodeling for Dual-Threshold Voltage Circuits.

Yongjun XuZuying LuoZhiguo ChenXiaowei Li
Published in: Asian Test Symposium (2003)
Keyphrases
  • low voltage
  • leakage current
  • silicon dioxide
  • electrical properties
  • power line
  • cmos technology
  • high speed
  • power system
  • design considerations
  • circuit design
  • pre determined
  • electronic circuits