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Some features of degradation in bipolar transistors at different test conditions for total ionizing dose effect.
Aleksandr S. Petrov
Viktor N. Ulimov
Published in:
Microelectron. Reliab. (2012)
Keyphrases
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feature vectors
positive and negative
classification accuracy
feature set
sufficient conditions
high density
extracted features
structural information
test data
feature extraction
co occurrence
feature space
test cases
classification method
low cost
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salient features
prior knowledge
integrated circuit