Fast image processing for optical metrology utilizing heterogeneous computer architectures.
Marc ReichenbachRalf SeidlerBenjamin PfundtDietmar FeyPublished in: Comput. Electr. Eng. (2014)
Keyphrases
- computer architecture
- image processing
- linear algebra
- computer systems
- parallel computers
- parallel computing
- compute intensive
- computer science department
- instruction set
- image enhancement
- computer vision
- image segmentation
- image denoising
- multi threaded
- image analysis
- computer science
- high performance computing
- boundary element
- numerical methods
- denoising
- multiscale
- fault tolerant
- partial differential equations
- operating system
- markov random field
- edge detection
- artificial intelligence
- machine learning