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An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time.
Takahiro J. Yamaguchi
H. X. Hou
Koji Takayama
Dave Armstrong
Masahiro Ishida
Mani Soma
Published in:
ITC (2007)
Keyphrases
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high frequency
similarity measure
test cases
subband
low frequency
image processing
image segmentation
discrete wavelet transform
multi resolution analysis
feature extraction
high resolution
wavelet coefficients
phase shifting