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Effects of Organizational Changes on Product Metrics and Defects.
Seiji Sato
Hironori Washizaki
Yoshiaki Fukazawa
Sakae Inoue
Hiroyuki Ono
Yoshiiku Hanai
Mikihiko Yamamoto
Published in:
APSEC (1) (2013)
Keyphrases
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information systems
information technology
life cycle
decision making
knowledge sharing
product design
defect detection
individual level
software engineering
software systems
management information systems
software process
end user computing
negative impact
defect classification