Sakae Inoue

Publication Activity (10 Years)

Years Active: 2013-2018
Publications (10 Years): 7

Top Topics

Adaptive Regularization

Defect Classification

Development Teams

Super Resolution

Top Venues

Int. J. Networked Distributed Comput.

Int. J. Softw. Eng. Knowl. Eng.

Publications

Taketo Tsunoda, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa
Developer Experience Considering Work Difficulty in Software Development. Int. J. Networked Distributed Comput. 6 (2) (2018)
Ryosuke Ishizue, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa, Katsushi Namba
Metrics Visualization Techniques Based on Historical Origins and Functional Layers for Developments by Multiple Organizations. Int. J. Softw. Eng. Knowl. Eng. 28 (1) (2018)
Taketo Tsunoda, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa
Empirical Study on Specification Metrics to Predict Volatility and Software Defects. TENCON (2018)
Taketo Tsunoda, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa
Evaluating the work of experienced and inexperienced developers considering work difficulty in sotware development. SNPD (2017)
Seiichi Gohshi, Sakae Inoue, Isao Masuda, Takashi Ichinose, Yoshika Tatsumi
Super Resolution for Smartphones. SIGMAP (2016)
Ryosuke Ishizue, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa, Katsushi Namba
Metrics Visualization Technique Based on the Origins and Function Layers for OSS-Based Development. VISSOFT (2016)
Reou Ando, Seiji Sato, Chihiro Uchida, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Masanobu Kanazawa, Kazutaka Sone, Katsushi Namba, Mikihiko Yamamoto
How Does Defect Removal Activity of Developer Vary with Development Experience? SEKE (2015)
Seiji Sato, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Mikihiko Yamamoto
Effects of Organizational Changes on Product Metrics and Defects. APSEC (1) (2013)