Concurrent Error Detection in Nonlinear Digital Circuits Using Time-Freeze Linearization.
Abhijit ChatterjeeRabindra K. RoyPublished in: IEEE Trans. Computers (1997)
Keyphrases
- digital circuits
- error detection
- error correction
- error recovery
- data cleansing
- fault tolerance
- data flow
- error correcting
- fault isolation
- evolvable hardware
- model based diagnosis
- finite state machines
- circuit design
- functional decomposition
- decision diagrams
- error resilient
- fault tolerant
- multi agent systems
- databases