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Logic-DRAM Co-Design to Exploit the Efficient Repair Technique for Stacked DRAM.

Minjie LvHongbin SunQiwei RenBing YuJingmin XinNanning Zheng
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2015)
Keyphrases
  • main memory
  • high density
  • dynamic random access memory
  • artificial intelligence
  • data structure
  • logic programming
  • modal logic
  • knowledge representation
  • nearest neighbor