A Novel Single Event Upset Tolerant 12T Memory Cell for Aerospace Applications.

Suraj Dohar Siddharth R. K.Vasantha M. H.Nithin Kumar Y. B.

Published in: ISVLSI (2020)

Keyphrases

real time
spatio temporal
event sequences
information systems
image sequences
main memory
memory requirements
memory usage
computing power
random access