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Nanorobotic Manipulation System for 360° Characterization Atomic Force Microscopy.

Yongbing WenHaojian LuYajing ShenHui Xie
Published in: IEEE Trans. Ind. Electron. (2020)
Keyphrases
  • atomic force microscopy
  • response time
  • decision making
  • multimedia
  • image sequences
  • reinforcement learning
  • cooperative
  • lower bound
  • query processing
  • special case
  • wireless sensor networks
  • dynamic programming