Performance study of strained III-V materials for ultra-thin body transistor applications.
Martin RauTroels MarkussenEnrico CarusoDavid EsseniElena GnaniAntonio GnudiPetr A. KhomyakovMathieu LuisierPatrik OsgnachPierpaolo PalestriSusanna ReggianiAndreas SchenkLuca SelmiKurt StokbroPublished in: ESSDERC (2016)