Diagonal Symmetric Pattern-Based Illumination Invariant Measure for Severe Illumination Variation Face Recognition.
Changhui HuFei WuJian YuXiaoyuan JingXiaobo LuPan LiuPublished in: IEEE Access (2020)
Keyphrases
- illumination invariant
- face recognition
- illumination variations
- face images
- local binary pattern
- illumination conditions
- pose variations
- feature extraction
- human faces
- principal component analysis
- gabor features
- linear discriminant analysis
- face detection
- face databases
- sparse representation
- object tracking
- facial images
- multiscale
- similarity measure
- partial occlusion
- feature points