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A Transistor-Level Probabilistic Approach for Reliability Analysis of Arithmetic Circuits With Applications to Emerging Technologies.
Bodapati Srinivasu
K. Sridharan
Published in:
IEEE Trans. Reliab. (2017)
Keyphrases
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emerging technologies
reliability analysis
high speed
learning technologies
neural network
user experience
low power
genetic algorithm
power plant
condition monitoring
floating gate